RESUMO
Spectroscopic ellipsometry is a potent method that is widely adopted for the measurement of thin film thickness and refractive index. Most conventional ellipsometers utilize mechanically rotating polarizers and grating-based spectrometers for spectropolarimetric detection. Here, we demonstrated a compact metasurface array-based spectroscopic ellipsometry system that allows single-shot spectropolarimetric detection and accurate determination of thin film properties without any mechanical movement. The silicon-based metasurface array with a highly anisotropic and diverse spectral response is combined with iterative optimization to reconstruct the full Stokes polarization spectrum of the light reflected by the thin film with high fidelity. Subsequently, the film thickness and refractive index can be determined by fitting the measurement results to a proper material model with high accuracy. Our approach opens up a new pathway towards a compact and robust spectroscopic ellipsometry system for the high throughput measurement of thin film properties.
RESUMO
The complete chloroplast genome of Geranium sibiricum Linne. was sequenced, assembled and annotated. It is a circular form of 150,656 bp in length, which was separated into four distinct regions, a large single copy (LSC) of 73,862 bp, a small single copy region (SSC) of 52,666 bp, two inverted repeats (IR) of 12,064bp. A total of 124 genes were predicted, of which, 87 encode proteins, 4 rRNA, 33 tRNA. The evolutionary history was inferred using Maximum Likelihood method, and the result indicates that G. sibiricum was grouped within Geraniaceae, and comprised a clade with Geranium palmatum under 100% Bootstrap value.
